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Showing results: 601 - 615 of 851 items found.

  • PXIe-5668, Up to 26.5 GHz PXI Vector Signal Analyzer

    783156-01 - NI

    Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.

  • PXIe-5668, Up to 26.5 GHz PXI Vector Signal Analyzer

    783156-02 - NI

    Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.

  • PXIe-5668, Up to 26.5 GHz PXI Vector Signal Analyzer

    783124-01 - NI

    Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.

  • Digital LOOP/PSC/LOAD Tester

    2811 LP - Standard Electric Works Co., Ltd

    ● Microprocessor-controlled.● Displays and sound warning if external voltage present.● Displays mains voltage, scroll trough menus.● Checks wiring integrity (LEDs and display).● Single button operation.● Auto-off/auto-ranging.● Combined prospective short circuit current, PSC and LOOP tester.● Built-in carry case, test leads in separate pouch.● Loop test for L-E and L-N and PSC.● Voltage test L-N and L-E.● Enables analysis of constituent components in L-E and L-N loops giving resistance of earth, neutral wire, live wire and transformer winding.● Display can be customized for special orders.● 60Hz available on request.

  • Adjustable Press Plate Bed of Nails Testers

    Protector Adjustable Family - Test Electronics

    Designed for testing heavy massive boards. Boards with heavy components like large transformers and inductors can destroy normal test fixtures. This design utilizes a 3 plate system where an internal lever actuated sub plate containing the test pins raises to probe the circuit board when the handle is pulled. Heavy boards can bend and break exposed test pins. Similarly large boards which need to be probed by very small delicate test pins can also benefit from this protected test fixture design. This fixture is recommended in situations where there is a high board mass to pin size ratio and pin protection is required. Front and rear panel modular inserts allow for easy updates and customizations to the user hardware interface.

  • Edge Press Technology Bed of Nails Testers

    Protector Edge Press Family - Test Electronics

    Designed for testing heavy massive boards. Boards with heavy components like large transformers and inductors can destroy normal test fixtures. This design utilizes a 3 plate system where an internal lever actuated sub plate containing the test pins raises to probe the circuit board when the handle is pulled. Heavy boards can bend and break exposed test pins. Similarly large boards which need to be probed by very small delicate test pins can also benefit from this protected test fixture design. This fixture is recommended in situations where there is a high board mass to pin size ratio and pin protection is required. Front and rear panel modular inserts allow for easy updates and customizations to the user hardware interface.

  • Press Down Rods Bed of Nails Testers

    Protector Press Rods Family - Test Electronics

    Designed for testing heavy massive boards. Boards with heavy components like large transformers and inductors can destroy normal test fixtures. This design utilizes a 3 plate system where an internal lever actuated sub plate containing the test pins raises to probe the circuit board when the handle is pulled. Heavy boards can bend and break exposed test pins. Similarly large boards which need to be probed by very small delicate test pins can also benefit from this protected test fixture design. This fixture is recommended in situations where there is a high board mass to pin size ratio and pin protection is required. Front and rear panel modular inserts allow for easy updates and customizations to the user hardware interface.

  • Flying Probe Test System

    A8a - atg Luther & Maelzer

    The A8a test system provides the flexibility of flying probe testers while delivering high throughput testing for bare board printed circuit boards (PCBs). The target market for the A8a is the electrical test of tablet and PC motherboards and high density interconnect (HDI) products for smart phones. The A8a is designed for high productivity, reliability and test accuracy. To achieve high throughput the key feature of the A8a is a new dual shuttle system, which reduces the product exchange time to zero seconds in automation mode. In combination with the fast test speed of up to 140 measurements/second the A8a will give customers a competitive test solution for batches up to 5000 boards. A typical cycle time of a 4-up smart phone board is about 2 minutes.

  • Circuit Breaker Analyzers & Timers

    CAT Handheld Series - IBEKO Power AB

    When it’s not practical to use conventional robust circuit breaker analyzers, a handheld circuit breaker analyzer and timer may come handy. DV Power has developed a unique CAT Handheld series. It is specially designed for testing of circuit breakers with one break per phase. Their compact and ergonomic design can provide a wide range of features and reliable operations in low, medium and high-voltage substations or in industrial environments.CAT Handheld series consists of two models, CAT-P and CAT-H. Both of them have a large (5,7 in) colored touch screen display. Because of that, test results are visible in dark places as well as in bright sunlight.Powerful internal Li-Ion battery of the instruments can last up to 8 hours of testing without recharging.CAT Handheld series records:main contacts operating times,contact synchronization,sequence time,a resistance of pre-insertion resistors,open and close coil currents,main contacts bounce time,auxiliary contact time,DC Voltage.Multiple operations, such as Open-Close and Open-Close-Open, can be initiated by using a predefined delay time or by triggering signal from current clamps connected to circuit breaker coil.CAT-H is capable of performing a coil control, while this feature is optional at CAT-P instrument. In contrast to CAT-H, CAT-P instrument can execute “First Trip” test.Both instruments display numerical and graphical results. Because of that, a user can easily overlay up to 4 records in the graphical form and make a quick on-site analysis of potential defects.A user can download test results to a PC via Bluetooth interface for more detailed analysis using DV Win software.

  • Semi-Rigid Test Probes Up to 6 GHz

    Fairview Microwave Inc.

    Fairview Microwave’s semi-rigid test probe assemblies come in multiple cable diameters to help when attaching the unterminated end of the probe to a circuit board trace. There are two versions including straight-cut probe ends for those that would like to customize the dimensions of the center conductor and dielectric dimensions, as well as pre-stripped probe ends that are ready for immediate use. By soldering the outer conductor to the signal ground and the exposed center conductor to the trace carrying the signal of interest, simple sampling measurements can be made without having to create a separate subassembly circuit board or add a connector to the circuit layout which can take up valuable real estate. Fairview provides 3 diameters of semi-rigid coax and 3 different lengths from 3 inches to 12 inches to fit a variety of trace widths and applications. All test probes are 100% RF tested to ensure the cable assemblies operate to 6 GHz and also to make sure that the SMA connector interface meets the 1.35:1 VSWR specification prior to shipping. To protect the small diameter coax from damage, each part is shipped in a clear protective tube that can also be used for storing the probes for future use.

  • Transformers

    Vertical Space - SV Probe, Inc.

    With our TrioTM vertical and LogicTouchTM fine pitch vertical technologies an interconnect, otherwise known as a space transformer (ST), is used between the printed circuit board and the probe head, transferring the test signal. SV TCL provides a variety of space transformers, each with its own specific benefits and applications. SV TCL offers a number of space transformer options including:

  • E-Z Check® Plus GFCI Circuit Tester

    61-051 - IDEAL Industries, Inc.

    *Tests for correct wiring, open ground, reverse polarity, open hot, open neutral, hot on neutral, hot and ground reversed with open hot in 3 wire, 120 VAC circuits*Simulates ground fault for testing GFCI*No-slip ergonomic design maximizes comfort*Premium neon lamps prevent false readings*Tough, impact-resistant case*2-year warranty

  • E-Z Check® Circuit Tester

    61-035 - IDEAL Industries, Inc.

    *Tests for correct wiring, open ground, reverse polarity, open hot, open neutral, hot on neutral, hot and ground reversed with open hot in 3 wire, 120 VAC circuits*Simulates ground fault for testing GFCIs*No-slip ergonomic design maximizes comfort*Premium neon lamps prevent false readings*Tough, impact-resistant case*2-year warranty

  • Handheld Device for Monitoring and Testing (BERT)

    GEM-Lightning - EDI Enterprises

    GEM-Lightning is a low-cost, handheld device for monitoring and testing (BERT) of T1 and E1 interfaces present in telecom central offices and test labs. GEM-Lightning is an essential tool for switch technicians and customer service personnel attempting to identify problematic circuits in the field. The portability GEM-Lightning makes it a must for the technician on the move while its remote logging capability allows the capture of information for later analysis.

  • PRECISION COMPONENT ANALYZER

    6400 SERIES - Wayne Kerr Electronics, Ltd.

    The 6430B and 6440B Precision Component Analyzers provide thorough and accurate testing of any passive component to high resolution. In particular, for capacitor manufacturers, the instruments provide capabilities for both fast automatic production testing and complete design characterisation. Users include designers of passive components, manufacturing test, designing and testing materials as well as circuit designers who are evaluating component characteristics.

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